by

3D X-DRAM claims a big bite out of the memory crunch

NEO Semiconductor reckons it has a new way to pack DRAM like NAND, and it says the first proof-of-concept chips have now checked out.

The idea, branded 3D X-DRAM, was unveiled in 2023 to tackle the DRAM capacity bottleneck by using a 3D NAND-style architecture rather than the usual flat layouts.

NEO has been pushing two main cell designs for 3D X-DRAM, built to slot into different products depending on what you are trying to accelerate.

The 1T1C cell, short for one transistor and one capacitor, is pitched as a high-density DRAM option that lines up with mainstream DRAM and HBM roadmaps.

The 3T0C cell, meaning three transistors and zero capacitors, is tuned for current-sensing work and is being aimed squarely at AI and in-memory computing.

NEO has talked up IGZO channel technology, claiming simulations show retention times up to 450 seconds, cutting refresh power by a hefty margin.

Those same simulations, using TCAD modelling, are claimed to show 10-nanosecond read and write performance while keeping that long retention window.

The manufacturing sales pitch is that it uses a modified 3D NAND process with minimal changes, so existing fabs could adapt without rebuilding everything from scratch.

NEO is positioning the tech as an alternative to high-bandwidth memory, which is fast but pricey, fiddly to validate and not much fun to produce at scale.

Instead of stacking multiple DRAM dies like HBM, 3D X-DRAM is designed to build a monolithic structure within a single die with multiple layers.

The firm says the proof-of-concept chips show it can be manufactured using existing 3D NAND infrastructure, swapping in DRAM layers where NAND would normally go.

NEO’s first reported proof-of-concept results are read/write latency: <10 ns and endurance: >10¹⁴ cycles, with a batch of disturbance and retention claims at 85°C.

It lists data retention: >1 second at 85°C, bit-line disturbance: >1 second at 85°C and word-line disturbance: >1 second at 85°C, framed as 15× better than the 64 ms JEDEC standard.

As AI and HPC memory demand climbs, the company is betting that higher-density DRAM becomes less optional and more mandatory, even if the hype merchants cannot stop yelling.

Intel is working on a similar idea called ZAM, but neither approach is in production yet, and the gap between a lab win and a server rack can be brutally long.

 

TOPICS:
3d nand architecture  ·  3d x-dram  ·  ai memory  ·  dram density  ·  hbm replacement  ·  igzo channel  ·  in-memory computing  ·  intel zam  ·  neo semiconductor

Latest articles

Share

Featured articles

Hot topics

No results found.

Latest reviews